The Centre for Electronics Engineering Studies (CEES), Faculty of Electrical Engineering, Universiti Teknologi Mara (UiTM), Shah Alam, Malaysia is pleased to announce the International Conference on Applied Electronic and Engineering 2017 (ICAEE2017), which will be held in Kuching, Sarawak, Malaysia from 7-8 August 2017.
The aim of the conference is to provide a platform for engineers, academia and researchers to disseminate and discuss their current research findings and also to explore recent development, current practices and future trends in Electronic Design, Devices, Systems and Applications.
We would like to invite local and international participants to attend and present their papers. Authors are invited to submit and present their high quality, original, unpublished papers in the following areas but not limited to:-
- Circuit and System
- VLSI System Design
- Bioinformatics and Biomemetics
- Embedded System Design and Application
- Automotive Engineering
- Robotic and Industrial Automations
- Motion Control and Mechatronics
- Power Electronic Converters, Drive and Applications
- Other Related Electronic Engineering and Technology Topics
*** The proceedings of International Conference on Applied Electronic and Engineering 2017 (ICAEE2017) will appear in the Open Access IOP Conference Series: Materials Science and Engineering (MSE), which is part of IOP Conference Series. All papers published in IOP Conference Series are fully citable and upon publication will be free to download. Authors may be interested to know that IOP Conference Series now receives in excess of 2.3 million article downloads per year, and is abstracted and indexed in Scopus, CPCI, Compendex and Inspec, among others. Citations are tracked online using IOP Publishing’s citing articles facility in addition to the full citation tracking facilities provided by Scopus.
***Selected of accepted papers are also invited for inclusion in International Journal on Advanced Science, Engineering and Information Technology (IJASEIT) (ISSN:2088-5334) indexed by Scopus.